Analytical TEM examinations of CoPt-TiO2 perpendicular magnetic recording media

Microscopy and Microanalysis

Volumn 13, Issue 2, 2007, Pages 70-79

  Risner, Juliet D ^a,d   Nolan, Thomas P ^b   Bentley, James ^c   Girt, Erol ^b   Harkness IV, Samuel D ^b   Sinclair, Robert ^a  

^a Stanford University   (United States)

^b SEAGATE TECHNOLOGY   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d SAN JOSE RESEARCH CENTER   (United States)

Author keywords

EDXS; EELS; EFTEM; Perpendicular magnetic recording media; TEM; TiO2

Indexed keywords

EID: 34247377805     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927607070213     Document Type: Article

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