Low-temperature behavior NaGaSi2O6

American Mineralogist

Volumn 92, Issue 4, 2007, Pages 560-569

  Nestola, Fabrizio ^a,b   Rotiroti, N ^c,d   Bruno, M ^e   Tribaudino, M ^f   van Smaalen, S ^c   Ohashi, H ^g   Redhammer, Günther J ^h  

^a UNIVERSITÄT BAYREUTH   (Germany)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF BAYREUTH   (Germany)

^d UNIVERSITY OF MILAN   (Italy)

^e UNIVERSITY OF TURIN   (Italy)

^f UNIVERSITY OF PARMA   (Italy)

^g HASHI Institute for Silicite Science Nishinakanobu   (Japan)

^h RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Clinopyroxene; Crystal structure; Low temperature; X ray diffraction

Indexed keywords

BOND LENGTH; CRYSTAL STRUCTURE; SILICATE MINERALS; SILICON; SODIUM COMPOUNDS; TEMPERATURE DISTRIBUTION; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

CLINOPYROXENES; LOW TEMPERATURE BEHAVIOR; LOW TEMPERATURES; MINIMUM TEMPERATURES; STRUCTURAL PHASE TRANSITION; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENCIES; UNIT CELL PARAMETERS;

GALLIUM COMPOUNDS;

CLINOPYROXENE; CRYSTAL STRUCTURE; LOW TEMPERATURE; PHASE TRANSITION; X-RAY DIFFRACTION;

EID: 34247361127     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2304     Document Type: Article

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