Characterization of hot wall deposited CdSe0.6Te0.4 thin films

Journal of New Materials for Electrochemical Systems

Volumn 10, Issue 1, 2007, Pages 55-59

  Balasundaraprabhu, R ^a   Jayakumar, S ^a   Kannan, M D ^a   Muthukumarasamy, N ^b   Velumani, S ^c   Castaneda H ^d  

^a PSG COLLEGE OF TECHNOLOGY   (India)

^b Department of Artificial Intelligence and Machine Learning   (India)

^c SCHOOL OF ENGINEERING AND SCIENCES   (Mexico)

^d BATTELLE MEMORIAL INSTITUTE   (United States)

Author keywords

CdSe0.6Te0.4 thin films; Hot wall deposition; Optical properties; Structure

Indexed keywords

CADMIUM COMPOUNDS; ELECTRODEPOSITION; SOLAR CELLS; SUBSTRATES; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

ABSORPTION COEFFICIENTS; CDSE0.6TE0.4 THIN FILMS; HOT WALL DEPOSITION; TRANSMITTANCE SPECTRA;

THIN FILMS;

EID: 34247282084     PISSN: 14802422     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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