Two-dimensional X-ray diffraction for structure and stress analysis

Materials Science Forum

Volumn 490-491, Issue , 2005, Pages 1-6

  He, Bob Baoping ^a   Xu, Kewei ^b   Wang, Fei ^b   Huang, Ping ^b  

^a BRUKER AXS INC   (United States)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Coating; Microstructure; Stress; Texture; Thin films; Two dimensional X ray diffraction

Indexed keywords

STRESS ANALYSIS; STRESS MEASUREMENT; TENSORS; THIN FILMS; TWO DIMENSIONAL; X RAY DIFFRACTION;

BRAGG CONDITIONS; DIFFRACTION SPACE; GEOMETRIC PARAMETERS; MATRIX TRANSFORMATION; TEXTURE MEASUREMENT;

MICROSTRUCTURE;

EID: 34247235685     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-969-5.1     Document Type: Conference Paper

References (9)

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