Factors that impact the critical charge of memory elements

Proceedings - IOLTS 2006: 12th IEEE International On-Line Testing Symposium

Volumn 2006, Issue , 2006, Pages 57-62

  Heijmen, Tino ^a   Giot, Damien ^b   Roche, Philippe ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b STMICROELECTRONICS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PULSE WIDTH MODULATION; TRANSISTORS; WAVEFORM ANALYSIS;

MEMORY ELEMENTS; PMOS; SUPPLY VOLTAGE;

STORAGE ALLOCATION (COMPUTER);

EID: 34247192070     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2006.35     Document Type: Conference Paper

References (10)

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