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Volumn 34, Issue 4, 2007, Pages 1021-1024
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Nonlinear dynamics of atomic force microscopy with intermittent contact
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGREES OF FREEDOM (MECHANICS);
MODAL ANALYSIS;
OSCILLATORS (ELECTRONIC);
SUBSTRATES;
INTERMITTENT CONTACT;
MODE COUPLING;
SINGLE MODE ANALYSIS;
ATOMIC FORCE MICROSCOPY;
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EID: 34247176221
PISSN: 09600779
EISSN: None
Source Type: Journal
DOI: 10.1016/j.chaos.2006.03.125 Document Type: Article |
Times cited : (16)
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References (9)
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