X-ray scattering studies of molecular linkages in Zeolite microcrystal monolayers

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5678-5682

  Lee, Heeju ^a   Park, Jin Seon ^a   Yoon, Kyung Byung ^a   Kim, Do Hyung ^b   Seo, Sun Hee ^b   Kang, Hyun Chul ^b   Noh, Do Young ^b   Kim, Hyunjung ^a  

^a Sogang University   (South Korea)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Molecular linkages; Monolayer; X ray reflectivity; Zeolite

Indexed keywords

LIGHT MEASUREMENT; MICROCRYSTALS; MOLECULAR DYNAMICS; SILICON WAFERS; X RAY SCATTERING; ZEOLITES;

MICROCRYSTAL MONOLAYERS_; MOLECULAR LINKAGES; X-RAY REFLECTIVITY;

MONOLAYERS;

EID: 34247163626     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.032     Document Type: Article

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