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X-ray diffraction analysis, C23H23FN 4O4; M, 450.46, Colorless block crystals, 0.24 times; 0.20 × 0.18 mm, Monoclinic, space group P 2(1)/n, a, 11.491 (5, b, 9.417(4, c, 20.617(8) Å, β, 91.187(8)°, V, 2230.5(16) Å3, Z, 4, Dc, 1.341 g.cm-3 F(000, 944, μ(MoKα, 0.099 mm-1. Intensity data were collected on CCD area detector diffractometer with graphite monochromated MoKα radiation (λ;, 0.71073 Å) using phi and omega scan mode with 1.98° < θ < 26.51°. 4588 unique reflections were measured and 2637 reflections with I>2σ(I) were used in the refinement. Structure solved by direct methods and expanded using Fourier techniques. The final cycle of full-matrix least squares technique to R, 0.0536 and wR, 0.1345
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