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Volumn 353, Issue 13-15 SPEC. ISS., 2007, Pages 1466-1469

Single oscillator energy and dispersion energy of uniform thin chalcogenide films from Cu-As-S-Se system

Author keywords

Chalcogenides; Optical spectroscopy

Indexed keywords

AMORPHOUS FILMS; CHALCOGENIDES; COPPER COMPOUNDS; DISPERSION (WAVES); EMISSION SPECTROSCOPY; REFRACTIVE INDEX; THERMAL EVAPORATION;

EID: 34247137900     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.10.074     Document Type: Article
Times cited : (14)

References (12)
  • 4
    • 34247172829 scopus 로고    scopus 로고
    • J.J. Ruiz-Perez, E. Marquez, Nuevos Metodos de Caracterization Optica de Semiconductores Basados en Medidas Espectroscopicas de Reflexion, Madrid, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.