A predictably low-leakage ASIC design style

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 15, Issue 3, 2007, Pages 276-285

  Jayakumar, Nikhil ^a   Khatri, Sunil P ^a  

^a Texas AandM University   (United States)

Author keywords

CMOS integrated circuits (ICs); IC design; Leakage currents; VLSI

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC BATTERIES; LEAKAGE CURRENTS;

APPLICATION-SPECIFIC INTEGRATED CIRCUIT (ASIC) DESIGN; IC DESIGN;

LOGIC DESIGN;

EID: 34247122803     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.893603     Document Type: Article

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