Nanoscale metrology

Measurement Science and Technology

Volumn 18, Issue 2, 2007, Pages

  Koenders, L ^a   Meli, F ^b   Wilkening, G ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b Swiss Federal Office of Metrology   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247107641     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/2/E01     Document Type: Editorial

References (0)