Investigation of an amorphous silicon EPID for measurement and quality assurance of enhanced dynamic wedge

Physics in Medicine and Biology

Volumn 52, Issue 4, 2007, Pages 1075-1087

  Greer, Peter B ^a,b   Barnes, Michael P ^a,b  

^a NEWCASTLE MATER HOSPITAL   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; IONIZATION CHAMBERS; PIXELS; PORTALS; QUALITY ASSURANCE; SEMICONDUCTOR DIODES;

DIODE-ARRAY MEASUREMENTS; ELECTRONIC PORTAL IMAGING DEVICE (EPID); ENHANCED DYNAMIC WEDGE (EDW); PIXEL SENSITIVITY;

IMAGING SYSTEMS;

SILICON;

ARTICLE; COLLIMATOR; IMAGE ENHANCEMENT; IMAGE QUALITY; IMAGING AND DISPLAY; LIGHT EMITTING DIODE; LIGHT SCATTERING; MEASUREMENT; PRIORITY JOURNAL; QUALITY CONTROL; RADIATION DOSE; RADIOBIOLOGY; HUMAN; INTENSITY MODULATED RADIATION THERAPY; METHODOLOGY; RADIOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STANDARD; STATISTICS;

HUMANS; PHANTOMS, IMAGING; QUALITY CONTROL; RADIOMETRY; RADIOTHERAPY DOSAGE; RADIOTHERAPY, INTENSITY-MODULATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SILICON;

EID: 34247095688     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/52/4/014     Document Type: Article

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