Fast image measurement based on LOG-Zernike operator

Guangdian Gongcheng/Opto-Electronic Engineering

Volumn 34, Issue 3, 2007, Pages

  Ge, Ji ^a  

^a JIANGXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Calibration; Image measurement; LOG operator; Subpixel orientation; Zernike moment

Indexed keywords

EID: 34147215980     PISSN: 1003501X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)