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Volumn 1, Issue 2, 2007, Pages 340-347

Wavelet-based partial discharge image denoising

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISCHARGES; IMAGE ANALYSIS; MEASUREMENT THEORY; NOISE ABATEMENT; ONLINE SYSTEMS;

EID: 34147206403     PISSN: 17518687     EISSN: None     Source Type: Journal    
DOI: 10.1049/iet-gtd:20060125     Document Type: Article
Times cited : (33)

References (34)
  • 2
    • 33645138640 scopus 로고    scopus 로고
    • Distortion of partial discharge images caused by high voltage harmonics
    • Florkowski, M., and Florkowska, B.: ' Distortion of partial discharge images caused by high voltage harmonics ', IEE Gener. Transm. Distrib., 2006, 152, (2), p. 171-180
    • (2006) IEE Gener. Transm. Distrib. , vol.152 , Issue.2 , pp. 171-180
    • Florkowski, M.1    Florkowska, B.2
  • 3
    • 34147207075 scopus 로고
    • New method to reduce the disturbance influences on the in situ partial discharge (PD) - Measurement and monitoring
    • 6th New Orleans
    • Borsi, H., and Hartje, M.: ' New method to reduce the disturbance influences on the in situ partial discharge (PD) - measurement and monitoring ', 6th, ISH, New Orleans, 1989
    • (1989) ISH
    • Borsi, H.1    Hartje, M.2
  • 4
    • 34147213929 scopus 로고
    • A new digital filter to reduce periodical noise in partial discharge measurements
    • 6th New Orleans
    • König, G., and Feser, K.: ' A new digital filter to reduce periodical noise in partial discharge measurements ', 6th, ISH, New Orleans, 1989
    • (1989) ISH
    • König, G.1    Feser, K.2
  • 6
    • 0035421392 scopus 로고    scopus 로고
    • Localisation and identification of corona forms based on phased-resolved images
    • Florkowska, B., Florkowski, M., and Zydroń, P.: ' Localisation and identification of corona forms based on phased-resolved images ', Meas. Sci. Technol., Inst. Phys. Publ., 2001, 12, (8), p. 1304-1310
    • (2001) Meas. Sci. Technol., Inst. Phys. Publ. , vol.12 , Issue.8 , pp. 1304-1310
    • Florkowska, B.1    Florkowski, M.2    Zydroń, P.3
  • 7
    • 0016102868 scopus 로고
    • Discharge detection under noisy conditions
    • Wilson, A.: ' Discharge detection under noisy conditions ', Proc. IEE, 1974, 121, (9), p. 993-996
    • (1974) Proc. IEE , vol.121 , Issue.9 , pp. 993-996
    • Wilson, A.1
  • 11
    • 0031125962 scopus 로고    scopus 로고
    • Transient power quality problems analyzed using wavelets
    • 0885-8977
    • Heydt, G.T., and Gall, A.W.: ' Transient power quality problems analyzed using wavelets ', IEEE Trans. Power Deliv., 1996, 12, (2), p. 908-915 0885-8977
    • (1996) IEEE Trans. Power Deliv. , vol.12 , Issue.2 , pp. 908-915
    • Heydt, G.T.1    Gall, A.W.2
  • 13
    • 0032022275 scopus 로고    scopus 로고
    • Short-time Fourier and wavelet transforms for fault detection in power transformers during impulse tests
    • 1350-2344
    • Satish, L.: ' Short-time Fourier and wavelet transforms for fault detection in power transformers during impulse tests ', IEE Proc., Sci. Meas. Technol., 1998, 145, (2), p. 77-84 1350-2344
    • (1998) IEE Proc., Sci. Meas. Technol. , vol.145 , Issue.2 , pp. 77-84
    • Satish, L.1
  • 14
    • 34147211386 scopus 로고    scopus 로고
    • Application of wavelet analysis to the detection of transformer winding deformation
    • 10th Canada
    • Wang, Y., Li, Y.M., and Qiu, Y.: ' Application of wavelet analysis to the detection of transformer winding deformation ', 10th, ISH, Canada, 1997
    • (1997) ISH
    • Wang, Y.1    Li, Y.M.2    Qiu, Y.3
  • 15
    • 0035400295 scopus 로고    scopus 로고
    • A de-noising scheme for enhancing wavelet-based power quality monitoring system
    • 0885-8977
    • Yang, H.T.: ' A de-noising scheme for enhancing wavelet-based power quality monitoring system ', IEEE Trans. Power Deliv., 2001, 16, (3), p. 353-360 0885-8977
    • (2001) IEEE Trans. Power Deliv. , vol.16 , Issue.3 , pp. 353-360
    • Yang, H.T.1
  • 16
    • 0024700097 scopus 로고    scopus 로고
    • A theory for multiresolution signal decomposition: The wavelet representation
    • Mallat, S.: ' A theory for multiresolution signal decomposition: the wavelet representation ', IEEE Pattern Anal. Machine Intell., 11, (7), p. 674-693
    • IEEE Pattern Anal. Machine Intell. , vol.11 , Issue.7 , pp. 674-693
    • Mallat, S.1
  • 17
    • 0029307534 scopus 로고    scopus 로고
    • Denoising by soft thresholding
    • 0018-9448
    • Donoho, D.L.: ' Denoising by soft thresholding ', IEEE Trans. Inf. Theory, 41, (3), p. 613-677 0018-9448
    • IEEE Trans. Inf. Theory , vol.41 , Issue.3 , pp. 613-677
    • Donoho, D.L.1
  • 18
    • 34147223275 scopus 로고    scopus 로고
    • Distortion of partial discharge images caused by high voltage harmonics
    • 3080 10th Montreal, Canada
    • Florkowski, M.: ' Distortion of partial discharge images caused by high voltage harmonics ', 3080, 10th, Int. Symp. on High Voltage Engineering, ISH'97, Montreal, Canada, 1997
    • (1997) Int. Symp. on High Voltage Engineering, ISH'97
    • Florkowski, M.1
  • 19
    • 34147216486 scopus 로고    scopus 로고
    • AGH Monographies No. 45, ISSN 0867-6631, Kraków
    • Florkowski, M.: 1996), AGH Monographies No. 45, ISSN 0867-6631, Kraków
    • (1996)
    • Florkowski, M.1
  • 21
    • 0026821306 scopus 로고
    • The importance of statistical characteristics of partial discharge data
    • 0018-9367
    • Fruth, B., and Niemeyer, L.: ' The importance of statistical characteristics of partial discharge data ', IEEE Trans. EI, 1992, EI-27, (1), p. 60-69 0018-9367
    • (1992) IEEE Trans. EI , vol.EI-27 , Issue.1 , pp. 60-69
    • Fruth, B.1    Niemeyer, L.2
  • 22
    • 0026818771 scopus 로고
    • Computer-aided recognition of discharge sources
    • 0018-9367
    • Gulski, E., and Kreuger, F.H.: ' Computer-aided recognition of discharge sources ', IEEE Trans. EI, 1992, EI-27, (1), p. 82-92 0018-9367
    • (1992) IEEE Trans. EI , vol.EI-27 , Issue.1 , pp. 82-92
    • Gulski, E.1    Kreuger, F.H.2
  • 23
    • 0029388084 scopus 로고
    • Automated recognition of partial discharges
    • 1070-9878
    • Krivda, A.: ' Automated recognition of partial discharges ', IEEE Trans. DEI, 1995, DEI-2, (5), p. 796-821 1070-9878
    • (1995) IEEE Trans. DEI , vol.DEI-2 , Issue.5 , pp. 796-821
    • Krivda, A.1
  • 24
    • 0035329616 scopus 로고    scopus 로고
    • The effect of voltage distortion on ageing acceleration of insulation system under partial discharge activity
    • Fabiani, D., and Montanari, G.C.: ' The effect of voltage distortion on ageing acceleration of insulation system under partial discharge activity ', IEEE Elect. Insul. Mag., 2001, 17, (3), p. 24-33
    • (2001) IEEE Elect. Insul. Mag. , vol.17 , Issue.3 , pp. 24-33
    • Fabiani, D.1    Montanari, G.C.2
  • 25
    • 0000133685 scopus 로고
    • Ten lectures on wavelets
    • Daubechies, I.: ' Ten lectures on wavelets ', CBMS, SIAM, 1994, p. 61
    • (1994) CBMS, SIAM , pp. 61
    • Daubechies, I.1
  • 26
    • 0028742193 scopus 로고
    • Wavelet analysis: Theory and applications
    • 0018-1153
    • Lee, D., and Yamamoto, A.: ' Wavelet analysis: theory and applications ', Hewlett-Packard J., 1994, 12, p. 44-54 0018-1153
    • (1994) Hewlett-Packard J. , vol.12 , pp. 44-54
    • Lee, D.1    Yamamoto, A.2
  • 27
  • 28
    • 0036505569 scopus 로고    scopus 로고
    • Automated wavelet selection and thresholding for PD detection
    • Ma, X., Zhou, C., and Kemp, I.J.: ' Automated wavelet selection and thresholding for PD detection ', IEEE DEIS Mag., 2002, 18, (2), p. 37-45
    • (2002) IEEE DEIS Mag. , vol.18 , Issue.2 , pp. 37-45
    • Ma, X.1    Zhou, C.2    Kemp, I.J.3
  • 29
    • 0036613463 scopus 로고    scopus 로고
    • Interpretation of wavelet analysis and its application in partial discharge detection
    • 1070-9878
    • Ma, X., Zhou, C., and Kemp, I.J.: ' Interpretation of wavelet analysis and its application in partial discharge detection ', IEEE Trans. DEI, 2002, 9, (3), p. 446-457 1070-9878
    • (2002) IEEE Trans. DEI , vol.9 , Issue.3 , pp. 446-457
    • Ma, X.1    Zhou, C.2    Kemp, I.J.3
  • 30
    • 0033907320 scopus 로고    scopus 로고
    • Wavelet analysis for classification of multi-source PD pattern
    • 1070-9878
    • Lalitha, E.M., and Satish, L.: ' Wavelet analysis for classification of multi-source PD pattern ', IEEE Trans. DEI, 2000, 7, (1), p. 40-47 1070-9878
    • (2000) IEEE Trans. DEI , vol.7 , Issue.1 , pp. 40-47
    • Lalitha, E.M.1    Satish, L.2
  • 31
    • 0034259592 scopus 로고    scopus 로고
    • Spatially adaptive wavelet thresholding with context modeling for image denoising
    • Chang, S.G., Yu, B., and Vetterli, M.: ' Spatially adaptive wavelet thresholding with context modeling for image denoising ', IEEE Int. Conf. on Image Process., 1998, p. 1522-1531
    • (1998) IEEE Int. Conf. on Image Process. , pp. 1522-1531
    • Chang, S.G.1    Yu, B.2    Vetterli, M.3
  • 33
    • 0037732564 scopus 로고    scopus 로고
    • Wavelet based denoising of partial discharge signals buried in excessive noise and interferences
    • 1070-9878
    • Satish, L., and Nazneen, B.: ' Wavelet based denoising of partial discharge signals buried in excessive noise and interferences ', IEEE Trans. DEI, 2003, 10, (2), p. 354-367 1070-9878
    • (2003) IEEE Trans. DEI , vol.10 , Issue.2 , pp. 354-367
    • Satish, L.1    Nazneen, B.2
  • 34
    • 0031076531 scopus 로고    scopus 로고
    • Data analytic wavelet threshold selection in 2D signal denoising
    • 1053-587X
    • Hilton, M.L., and Ogden, R.T.: ' Data analytic wavelet threshold selection in 2D signal denoising ', IEEE Trans. Signal Process., 1996, 45, p. 496-500 1053-587X
    • (1996) IEEE Trans. Signal Process. , vol.45 , pp. 496-500
    • Hilton, M.L.1    Ogden, R.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.