In-situ imaging of crack growth with piezoelectric wafer active sensors

Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference

Volumn 9, Issue , 2006, Pages 6192-6213

  Giurgiutiu, Victor ^a,b   Jenkins, Christopher ^a   Kendall, James ^a   Yu, Lingyu ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

^b AIAA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA CONCENTRATORS; LAMB WAVE MODES; PIEZOELECTRIC WAFER ACTIVE SENSORS (PWAS); ULTRASONIC INSPECTION;

CRACK PROPAGATION; PIEZOELECTRIC DEVICES; PLATES (STRUCTURAL COMPONENTS); STRUCTURAL HEALTH MONITORING; THIN WALLED STRUCTURES; ULTRASONIC IMAGING; WIRELESS TELECOMMUNICATION SYSTEMS;

IMAGE SENSORS;

EID: 34147205398     PISSN: 02734508     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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