Combining global and local classifiers with Bayesian network

Proceedings - International Conference on Pattern Recognition

Volumn 3, Issue , 2006, Pages 1212-1215

  Matos, Leonardo Nogueira ^a   De Carvalho, João Marques ^b  

^a FEDERAL UNIVERSITY OF SERGIPE   (Brazil)

^b FEDERAL UNIVERSITY OF CAMPINA GRANDE   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE SPACE; INFERENCE MECHANISM; RECOGNITION RATES;

CLASSIFICATION (OF INFORMATION); FEATURE EXTRACTION; IMAGE SEGMENTATION; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS;

BAYESIAN NETWORKS;

EID: 34147185137     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.2006.386     Document Type: Conference Paper

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