Estimation of sensitive equipment disruptions due to voltage sags

IEEE Transactions on Power Delivery

Volumn 22, Issue 2, 2007, Pages 1132-1137

  Lu, Chan Nan ^a   Shen, Cheng Chieh ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

Disturbance level; Equipment disruption; Fuzzy index; Immunity level; Power quality (PQ); Voltage sag

Indexed keywords

FUZZY INFERENCE; POWER QUALITY; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; VOLTAGE CONTROL;

DISTURBANCE LEVEL; EQUIPMENT DISRUPTION; FUZZY INDEX; IMMUNITY LEVEL;

ELECTRIC POTENTIAL;

EID: 34147175602     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2007.893433     Document Type: Article

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