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Volumn 258, Issue 1, 2007, Pages 61-67

Charge transfer rates for xenon Rydberg atoms at metal and semiconductor surfaces

Author keywords

Charge transfer; Surface ionization; Tunneling

Indexed keywords

CHARGE TRANSFER; ELECTRON TUNNELING; IONIZATION; PERTURBATION TECHNIQUES; SEMICONDUCTOR MATERIALS; XENON;

EID: 34147169222     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.094     Document Type: Article
Times cited : (13)

References (19)
  • 10
    • 0001605708 scopus 로고
    • (Sov. Phys. JETP 27 (1968) 178)
    • Chaplik A.V. Zh. Eksp. Teor. Fiz. 54 (1968) 332 (Sov. Phys. JETP 27 (1968) 178)
    • (1968) Zh. Eksp. Teor. Fiz. , vol.54 , pp. 332
    • Chaplik, A.V.1
  • 19
    • 34147109916 scopus 로고    scopus 로고
    • H.R. Dunham, S. Wethekam, J.C. Lancaster, F.B. Dunning, Nucl. Instr. and Meth. B, in press, doi:10.1016/j.nimb.2006.11.091.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.