Crystallization effects in annealed thin GeS2 films photodiffused with Ag

Journal of Non-Crystalline Solids

Volumn 353, Issue 13-15 SPEC. ISS., 2007, Pages 1454-1459

  Balakrishnan, Murali ^a   Kozicki, Michael N ^a   Poweleit, Christian D ^a   Bhagat, Shekhar ^a   Alford, Terry L ^a   Mitkova, Maria ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Boise State University   (United States)

Author keywords

Chalcogenides; Photoinduced effects; Raman spectroscopy; Rutherford backscattering; X ray diffraction

Indexed keywords

CHALCOGENIDES; CRYSTALLIZATION; GERMANIUM COMPOUNDS; OPTICAL FILMS; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILVER; X RAY DIFFRACTION;

PHOTODIFFUSION; PHOTOINDUCED EFFECTS;

THIN FILMS;

EID: 34147135976     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.09.071     Document Type: Article

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