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System for Implementing a Column Redundancy Scheme for Arrays with Controls that Span Multiple Data Bits,
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Triple Damascene Fuse,
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Electrically Programmable Fuse (eFUSE) Using Electromigration in Silicides
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Testing the Enterprise IBM System/390* Multi Processor
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Testing the 400MHz IBM Generation-4 CMOS Chip
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0034822478
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Shared Fuse Macro for Multiple Embedded Memory Devices with Redundancy Compression Scheme
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