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Volumn 142, Issue 3-4, 2006, Pages 141-146
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An approach to the origin of transport properties in a series of molecular conductors, based on XPS and spectroscopic studies
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Author keywords
Electrodeposition; Molecular conductor; RAMAN; Thin film; XPS
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Indexed keywords
ELECTRODEPOSITION;
RAMAN SPECTROSCOPY;
STOICHIOMETRY;
THIN FILMS;
TRANSPORT PROPERTIES;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHARGE STATE;
MOLECULAR CONDUCTOR;
CONDUCTIVE FILMS;
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EID: 34147097188
PISSN: 00222291
EISSN: 15737357
Source Type: Journal
DOI: 10.1007/BF02679483 Document Type: Conference Paper |
Times cited : (7)
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References (15)
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