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Volumn 142, Issue 3-4, 2006, Pages 141-146

An approach to the origin of transport properties in a series of molecular conductors, based on XPS and spectroscopic studies

Author keywords

Electrodeposition; Molecular conductor; RAMAN; Thin film; XPS

Indexed keywords

ELECTRODEPOSITION; RAMAN SPECTROSCOPY; STOICHIOMETRY; THIN FILMS; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34147097188     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/BF02679483     Document Type: Conference Paper
Times cited : (7)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.