Effect of internal radiation on the solid-liquid interface shape in low and high thermal gradient Czochralski oxide growth

Journal of Crystal Growth

Volumn 303, Issue 1 SPEC. ISS., 2007, Pages 156-160

  Budenkova, O ^a   Vasiliev, M ^a   Yuferev, V ^a   Kalaev, V ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b STR GmbH   (Germany)

Author keywords

A1. Computer simulation; A1. Heat transfer; A1. Radiation; A1. Specular reflection; A2. Czochralski method; B1. Oxides

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; CRYSTALLIZATION; HEAT RADIATION; PHASE INTERFACES; THERMAL GRADIENTS;

BACK-MELTING PROCESS; INTERFACE INVERSION; OPTICALLY THIN CRYSTALS; SPECULAR REFLECTION;

CRYSTAL GROWTH FROM MELT;

EID: 34047267454     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.12.055     Document Type: Article

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