Transmission electron microscopy of Co2(Cr1-xFex)Al sputtered films and their magnetic tunneling junctions

Journal of Magnetism and Magnetic Materials

Volumn 313, Issue 2, 2007, Pages 378-382

  Takahashi, Y K ^a   Ohkubo, T ^a   Hono, K ^a   Okamura, S ^b   Tezuka, N ^b   Inomata, K ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Co2(Cr1 xFex)Al film; Magnetic tunnel junctions; Microstructure

Indexed keywords

COBALT COMPOUNDS; MAGNETORESISTANCE; MICROSTRUCTURE; PHASE SEPARATION; SPIN POLARIZATION; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; TUNNEL JUNCTIONS;

INTERFACIAL STRUCTURE; MAGNETIC TUNNELING JUNCTIONS;

METALLIC FILMS;

EID: 34047260748     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.09.023     Document Type: Article

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