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Volumn 436, Issue 1-2, 2007, Pages 313-318

The isothermal section of the Al-Cr-Si system at 800 °C and the crystal structure of τ2 (Cr3Al9Si)

Author keywords

Intermetallics; Scanning electron microscopy (SEM); X ray diffraction

Indexed keywords

BINARY MIXTURES; CRYSTAL STRUCTURE; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; TERNARY ALLOYS; X RAY DIFFRACTION;

EID: 34047244233     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2006.07.038     Document Type: Article
Times cited : (23)

References (17)
  • 14
    • 34047259147 scopus 로고    scopus 로고
    • H.-L. Chen, J.C. Schuster, F. Weitzer, A DTA investigation of the Al-Cr-Si system, submitted for publication.
  • 17
    • 34047245743 scopus 로고    scopus 로고
    • 11 X-ray powder diffraction data, submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.