SCOPUS 정보 검색 플랫폼

Volumn 46, Issue 3, 2006, Pages 329-336

Controlled layer-by-layer formation of ultrathin oxide films on silver Island films for surface-enhanced raman scattering measurement

(3) Mahurin, Shannon M a,b Bao, Lili a Dai, Sheng a

a OAK RIDGE NATIONAL LABORATORY (United States)

b OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34047243858 PISSN: 00212148 EISSN: None Source Type: Journal
DOI: 10.1560/KL34-5H4V-3770-8216 Document Type: Article

Times cited : (7)

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