Practical stability of perturbed event-driven controlled linear systems

Proceedings of the American Control Conference

Volumn 2006, Issue , 2006, Pages 4379-4386

  Heemels, W P M H ^a   Sandee, J H ^b  

^a EMBEDDED SYSTEMS INSTITUTE   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Piecewise linear systems; Practical stability; Processor load; Robust invariance; Sampled data control; Ultimate boundedness

Indexed keywords

COMPUTATION THEORY; ERROR ANALYSIS; PERTURBATION TECHNIQUES; SYSTEM STABILITY; TRACKING (POSITION);

PIECEWISE LINEAR SYSTEMS; PRACTICAL STABILITY; PROCESSOR LOAD; ROBUST INVARIANCE; SAMPLED-DATA CONTROL; ULTIMATE BOUNDEDNESS;

LINEAR SYSTEMS;

EID: 34047228567     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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