Resistance-based scaling of noise temperatures from 1 kHz to 1 MHz

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 481-485

  Labenski, John R ^a   Tew, W L ^a   Nam, S W ^a   Benz, Samuel P ^a   Dresselhaus, Paul D ^a   Burroughs Jr , Charles J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Noise; Noise measurement; Temperature; Temperature measurement

Indexed keywords

CORRELATION METHODS; FREQUENCY DOMAIN ANALYSIS; TEMPERATURE MEASUREMENT;

JOHNSON NOISE THERMOMETRY; NOISE MEASUREMENT; NOISE TEMPERATURE;

SPURIOUS SIGNAL NOISE;

EID: 34047213553     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.891070     Document Type: Conference Paper

References (8)

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