Detecting rotational symmetry under affine projection

Proceedings - International Conference on Pattern Recognition

Volumn 2, Issue , 2006, Pages 292-295

  Cornelius, Hugo ^a   Loy, Gareth ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; SURFACE MORPHOLOGY;

COMPLEX BACKGROUNDS; FEATURE DETECTORS; LOCAL AFFINE DISTORTION; ROTATIONAL SYMMETRY;

FEATURE EXTRACTION;

EID: 34047202671     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.2006.434     Document Type: Conference Paper

References (11)

1. Y. Keller and Y. Shkolnisky. An algebraic approach to symmetry detection. In ICPR (3), pages 186-189, 2004.
2. F. Labonté, Y. Shapira, and P. Cohen. Perceptually plausible model for global symmetry detection. In ICCV, 1993.
3. Y. Lei and K. Wong. Detection and localisation of reflectional and rotational symmetry under weak perspective projection. Pattern Recognition, 32(2): 167-180, 1999.
4. D. G. Lowe. Distinctive image features from scale-invariant keypoints. IJCV, 60(2):91-110, 2004.
5. G. Loy and J.-O. Eklundh. Detecting symmetry and symmetric constellations of features. In ECCV, 2006.
6. L. Lucchese. Frequency domain classification of cyclic and dihedral symmetries of finite 2-d patterns. Pattern Recognition, 37(12):2263-2280, 2004.
7. K. Mikolajczyk and C. Schmid. A performance evaluation of local descriptors. IEEE PAMI, pages 1615-1630, 2005.
8. K. Mikolajczyk, T. Tuytelaars, C. Schmid, A. Zisserman, J. Matas, F. Schaffalitzky, T. Kadir, and L. V. Gool. A comparison of affine region detectors. Accepted in IJCV, 2005.
9. V. S. N. Prasad and L. S. Davis. Detecting rotational symmetries. In ICCV, 2005.
10. D. Shen, H. Ip, and E. Teoh. Robust detection of skewed symmetries. In ICPR, volume 3, pages 1010-1013, 2000.
11. R. K. K. Yip. A hough transform technique for the detection of parallel projected rotational symmetry. Pattern Recognition Letters, 20(10):991-1004, 1999.