Binary-tree multi-classifier for welding defects and its application based on SVM

Proceedings of the World Congress on Intelligent Control and Automation (WCICA)

Volumn 2, Issue , 2006, Pages 8509-8513

  Gao, Ding ^a   Liu, Yuan Xiang ^a,b   Zhang, Xiao Guang ^a  

^a CHINA UNIVERSITY OF MINING AND TECHNOLOGY   (China)

^b Liuwan Coal Mine   (China)

Author keywords

Binary tree; Multi classifier; SVM; Welding defects

Indexed keywords

ALGORITHMS; DECISION MAKING; FEATURE EXTRACTION; IMAGE ANALYSIS; PARAMETER ESTIMATION; SUPPORT VECTOR MACHINES;

DEFECT RECOGNITION; FEATURE PARAMETERS; MULTICLASSIFIERS; WELDING DEFECTS;

BINARY TREES;

EID: 34047200351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCICA.2006.1713639     Document Type: Conference Paper

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