Modeling radiation sources of electronic components

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2006, Pages 89-92

  Gilabert, Yolanda Vives ^a   Arcambal, Christian ^a   Baudry, David ^a   Louis, Anne ^a   Mazari, Bélahcène ^a   Alves, Sylvain ^b   Stanislawiak, Michel ^b   Eudeline, Philippe ^b  

^a École Supérieure d'Ingénieurs en Génie Électrique   (France)

^b THALES   (France)

Author keywords

Electromagnetic radiated emissions; Modeling; Nearfield measurement

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC WAVES; MICROCONTROLLERS; OSCILLATORS (ELECTRONIC); PERTURBATION TECHNIQUES; SIGNAL INTERFERENCE;

ELECTROMAGNETIC RADIATED EMISSIONS; ELECTRONIC COMPONENTS; NEARFIELD MEASUREMENT; RADIATION SOURCES;

PRINTED CIRCUIT BOARDS;

EID: 34047199878     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/isemc.2006.1706269     Document Type: Conference Paper

References (3)

1. J.R. Regué, M. Ribó, J.M. Garrell and A. Martin "A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization" , IEEE Trans, on EMC, vol. 43, no. 4, november 2001, pp. 520-530
2. F. De Daran, J. Chollet-Ricard, F. Lafon and O. Maurice,. "Prediction of the Field Radiated at One Meter from PCB's and Microprocessors from Near EM Field Cartography", IEEE Int. Symp. On EMC, Istanbul, Turkey, May 2003
3. D. Baudry, "Conception, validation et exploitation d'un dispositif de mesure de champs électromagnétiques proches -.Application CEM.-", Thesis work, april 2005