Dielectric material characterization using rough surface transmission lines

59th ARFTG Conference Digest Spring 2002: Test, Measurement, and Characterization of High Speed Digital Components and Systems, ARFTG Spring 2002

Volumn , Issue , 2002, Pages 49-52

  Han, Dong Ho ^a   Li, Y L ^a   Vieweg, R A ^a   Ruttan, T G ^a   Polka, L A ^a  

^a M/S CH 157 ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRIC LINES; FREQUENCY RESPONSE; MICROSTRIP LINES; POLYCHLORINATED BIPHENYLS; SCATTERING PARAMETERS; SURFACE ROUGHNESS;

CHARACTERIZATION METHODS; DIELECTRIC CHARACTERIZATION; DIELECTRIC MATERIAL CHARACTERIZATION; DIRECT MEASUREMENT; EMPIRICAL EQUATIONS; FREQUENCY-DEPENDENT LOSS; SUBSTRATE MATERIAL; SURFACE ROUGHNESS EFFECTS;

CHARACTERIZATION;

EID: 34047193443     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2002.1214679     Document Type: Conference Paper

References (8)

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4. th Tropical Meeting on Electrical Performance of Electronic Packaging, Cambridge, MA, Oct. 2001
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