Structural and electrical characterization of CeAlO3 ceramics

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Feteira, Antonio ^a   Sinclair, Derek C ^a   Lanagan, Michael T ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIXED OXIDE ROUTE; NEEDLE-SHAPED FERROELASTIC DOMAINS; RANDOM DISTRIBUTION; ROOM TEMPERATURE;

CERIUM COMPOUNDS; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; MICROSTRUCTURE; PERMITTIVITY; SINTERING; X RAY DIFFRACTION ANALYSIS;

CERAMIC MATERIALS;

EID: 34047175872     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2559648     Document Type: Article

References (26)

1. S. Y. Cho, I. T. Kim, and K. S. Hong, J. Mater. Res. 14, 114 (1999).
2. P. H. Sun, T. Nakamura, Y. J. Shan, Y. Inaguma, M. Itoh, and T. Kitamura, Jpn. J. Appl. Phys., Part 1 37, 5625 (1998).
3. B. Jancar, D. Suvorov, M. Valant, and G. Drazic, J. Eur. Ceram. Soc. 23, 1391 (2003).
4. X. Wang, H. Yamada, K. Nishikubo, and C. N. Xu, Jpn. J. Appl. Phys., Part 1 44, 961 (2005).
5. B. B. Van Aken, T. T. M. Palstra, A. Filippetti, and N. A. Spaldin, Nat. Mater. 3, 164 (2004).
6. W. T. Fu and D. J. W. Ijdo, J. Solid State Chem. 177, 2973 (2004).
7. D. C. Sinclair, T. B. Adams, F. D. Morrison, and A. R. West, Appl. Phys. Lett. 80, 2153 (2002).
8. M. Li, A. Feteira, and D. C. Sinclair, J. Appl. Phys. 98, 084101 (2005).
9. R. D. Shannon, J. Appl. Phys. 73, 348 (1993).
10. S. J. Penn, N. M. Alford, A. Templeton, X. R. Wang, M. S. Xu, M. Reece, and K. Schrapel, J. Am. Ceram. Soc. 80, 1885 (1997).
11. W. H. Zachariasen, Acta Crystallogr. 2, 388 (1949).
12. A. C. Tas and M. Akinc, J. Am. Ceram. Soc. 77, 2961 (1994).
13. A. M. Glazer, Acta Crystallogr., Sect. A: Cryst. Phys., Difft., Theor. Gen. Crystallogr. 31, 756 (1975).
14. I. M. Reaney and R. Ubic, Ferroelectrics 228, 23 (1999).
15. M. Drofenik, J. Am. Ceram. Soc. 76, 123 (1993).
16. W. T. Fu and D. J. W. Ijdo, J. Solid State Chem. 179, 2732 (2006).
17. C. H. Kim, S. Y. Cho, I. T. Kim, W. J. Cho, and K. S. Hong, Mater. Res. Bull. 36, 1561 (2001).
18. A. I. Shelykh and B. T. Melekh, Phys. Solid State 45, 238 (2003).
19. W. Wersing, Curr. Opin. Solid State Mater. Sci. l, 715 (1996).
20. R. Zurmuhlen et al., J. Appl. Phys. 77, 5351 (1995).
21. A. Feteira, L. Gillie, R. Elsebrock, and D. C. Sinclair, J. Am. Ceram. Soc. (to be published).
22. R. G. Geyer and J. Krupka, Conference on Precision Electromagnetic Measurements Digest, 1996, pp. 206 and 207.
23. C. Vineis, P. K. Davies, T. Negas, and S. Bell, Mater. Res. Bull. 31, 431 (1996).
24. C. W. A. Paschoal, R. L. Moreira, K. P. Surendran, and M. T. Sebastian, J. Mater. Res. 20, 1164(2005).
25. T. Shishido, H. Iwasaki, N. Toyota, M. Tanaka, H. Horiuchi, S. Nojima, S. Nakagawa, and T. Fukada, J. alloys Compd. 209, L11 (1994).
26. I. Levin, J. Y. Chan, J. E. Maslar. T. A. Vanderah, and S. M. Bell, J. Appl. Phys. 90, 904 (2001).