Feedback system for improving the performance of extended x-ray absorption fine structure measurements

Review of Scientific Instruments

Volumn 78, Issue 3, 2007, Pages

  Kudo, Togo ^a   Tanida, Hajime ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL SYSTEM ANALYSIS; CRYSTAL STRUCTURE; MONOCHROMATORS; SENSITIVITY ANALYSIS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

DOUBLE CRYSTAL MONOCHROMATORS (DCM); ENERGY TUNING; FEEDBACK SYSTEMS; PHASE SENSITIVE DETECTORS;

FEEDBACK CONTROL;

EID: 34047171514     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2713436     Document Type: Article

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