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Volumn 2006, Issue , 2006, Pages

Why prognostics for avionics?

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE MECHANISMS; POTENTIAL EQUIPMENT FAILURES; PROGNOSTICS; SOLID STATE ELECTRONICS;

EID: 34047169918     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 1
    • 34047126880 scopus 로고    scopus 로고
    • Blish, Richard and Noel Durant, Semiconductor Device Reliability Failure Models, International Sematech, Technology Transfer #00053955A-XFR, May 312, 2000
    • Blish, Richard and Noel Durant, "Semiconductor Device Reliability Failure Models", International Sematech, Technology Transfer #00053955A-XFR, May 312, 2000
  • 2
    • 34047182591 scopus 로고    scopus 로고
    • Aircraft Maintenance Technology Magazine,_ 2005 Salary Survey, August 05. Data for Central, Southwest and Southern Regions.
    • Aircraft Maintenance Technology Magazine,_ "2005 Salary Survey", August 05. Data for Central, Southwest and Southern Regions.
  • 5
    • 34748872970 scopus 로고    scopus 로고
    • Distributed Multi-Algorithm Diagnostics and Prognostics for US Navy Ships
    • Hadden, George D., et al. "Distributed Multi-Algorithm Diagnostics and Prognostics for US Navy Ships". Proc. 2002 AAAI Spring Symposium
    • Proc. 2002 AAAI Spring Symposium
    • Hadden, G.D.1
  • 6
    • 34047123714 scopus 로고    scopus 로고
    • Reliability Analysis Center (RAC), Failure Mode/Mechanism Distributions, FMD-91
    • Reliability Analysis Center (RAC), Failure Mode/Mechanism Distributions, FMD-91
  • 8
    • 34047146973 scopus 로고    scopus 로고
    • Contract N68335-04-C-0087
    • Contract N68335-04-C-0087


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.