Low-Tc Josephson junctions with tailored barrier

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Weides, M ^a   Schindler, C ^a   Kohlstedt, H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ETCHING; FERROMAGNETIC MATERIALS; FILM THICKNESS; PHOTOLITHOGRAPHY;

FRAUNHOFER PATTERN; JUNCTION AREA; JUNCTION PARAMETERS; TUNABLE RESONATORS;

TUNNEL JUNCTIONS;

EID: 34047151759     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2655487     Document Type: Article

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