Length distribution analysis for tin whisker growth

IEEE Transactions on Electronics Packaging Manufacturing

Volumn 30, Issue 1, 2007, Pages 36-40

  Fukuda, Yuki ^a,b   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b Philips Lumileds Lighting Company   (United States)

Author keywords

Annealing; Density; Length; Matte Sn; Reflow; Tin whiskers

Indexed keywords

ANNEALING; CRYSTAL GROWTH; CRYSTAL WHISKERS; DENSITY MEASUREMENT (SPECIFIC GRAVITY); SEMICONDUCTOR DEVICES;

WHISKER DENSITY; WHISKER GROWTH; WHISKER LENGTH;

TIN ALLOYS;

EID: 34047149305     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2006.890638     Document Type: Article

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