Radiation and thermal effects on the dielectric relaxation properties of PEEK

Journal of Industrial and Engineering Chemistry

Volumn 13, Issue 2, 2007, Pages 250-256

  Kang, Phil Hyun ^a   Lee, Chung ^a   Kim, Ki Yup ^a  

^a Korea Atomic Energy Research Institute   (South Korea)

Author keywords

Dielectric relaxation; PEEK; Radiation; Thermal aging

Indexed keywords

EID: 34047138348     PISSN: 1226086X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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