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Volumn 2006, Issue , 2006, Pages 373-378

An approach for specification based testing for platforms

Author keywords

API testing; Platforms; Specification based testing

Indexed keywords

AUTOMATION; COMPUTER SYSTEM RECOVERY; INFORMATION SCIENCE; SOFTWARE ENGINEERING; SPECIFICATIONS;

EID: 34047136131     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (15)
  • 7
    • 34047160111 scopus 로고    scopus 로고
    • ISpec: Towards Practical and Sound Interface Specifications
    • H. Jonkers. ISpec: Towards Practical and Sound Interface Specifications. In Integrated Formal Methods, LNCS 1945, pages 116-135, 2000.
    • (2000) Integrated Formal Methods, LNCS 1945 , pp. 116-135
    • Jonkers, H.1
  • 9
    • 0001647941 scopus 로고    scopus 로고
    • Fault classes and error detection in specification based testing
    • D. R. Kuhn. Fault classes and error detection in specification based testing. ACM Transactions on Software Engineering Methodology, 8(4):411-424, 1999.
    • (1999) ACM Transactions on Software Engineering Methodology , vol.8 , Issue.4 , pp. 411-424
    • Kuhn, D.R.1
  • 11
    • 1842607387 scopus 로고    scopus 로고
    • Comparison of Fault Classes in Specification-Based Testing
    • Vadim Okun, Paul E. Black, and Yaacov Yesha. Comparison of Fault Classes in Specification-Based Testing. Information and Software Technology, 46(8):525-533, 2004.
    • (2004) Information and Software Technology , vol.46 , Issue.8 , pp. 525-533
    • Okun, V.1    Black, P.E.2    Yesha, Y.3
  • 12
    • 0024033855 scopus 로고
    • The category-partition method for specifying and generating functional tests
    • T. J. Ostrand and M. J. Balcer. The category-partition method for specifying and generating functional tests. Communications of the ACM, 31(6):676-686, 1988.
    • (1988) Communications of the ACM , vol.31 , Issue.6 , pp. 676-686
    • Ostrand, T.J.1    Balcer, M.J.2
  • 15
    • 34047138584 scopus 로고    scopus 로고
    • PhilipsSemiconductors.http://www.semiconductors.philips.com/ products/nexperia/.
    • PhilipsSemiconductors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.