Optical characterisation of chemically deposited Pb(1-x)Cd xS films and a Pb1-xCdxS(n)/Si(p) heterojunction

EPJ Applied Physics

Volumn 37, Issue 3, 2007, Pages 241-245

  Ounissi, A ^a   Ouddai, N ^a   Achour, S ^b  

^a UNIVERSITY OF BATNA   (Algeria)

^b Universite Mentouri Constantine   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; CONCENTRATION (PROCESS); ENERGY GAP; HEAT TREATMENT; LEAD; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE PARAMETERS; TERNARY COMPOUNDS;

HETEROJUNCTIONS;

EID: 34047118504     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2007034     Document Type: Article

References (5)

1. R.M. Warner, Circuits intégrés étude et réalisation, traducted by P. Barbier (Dunod, Paris, 1968), p. 353
2. B.B. Nayak, H.N. Acharya, G.B. Mitra, B. Mater. Sci. 3, 317 (1981)
3. B.B. Nayak, H.N. Acharya, J. Mater. Sci. Lett. 4, 651 (1985)
4. A.L. Dawar, O.P. Taneja Partap Kumar, P.C. Mathur, Thin Solid Films 79, 185 (1981)
5. R.L. Anderson, Solid State Electron. 1.5, 341 (1962)