Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: "Atom-probe tomography" [Rev. Sci. Instrum. 78, 031101 (2007)]

Review of Scientific Instruments

Volumn 78, Issue 3, 2007, Pages

  Seidman, David N ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE TOMOGRAPHY; FIELD ION MICROSCOPY; LENSLESS POINT PROJECTION MICROSCOPES; SINGLE ATOMS;

COMPUTER SOFTWARE; LATTICE CONSTANTS; RADIATION DAMAGE; TOMOGRAPHY;

ION MICROSCOPES;

EID: 34047112319     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2716503     Document Type: Review

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