Efficient unknown blocking using LFSR reseeding

Proceedings -Design, Automation and Test in Europe, DATE

Volumn 1, Issue , 2006, Pages

  Wang, Seongmoon ^a   Balakrishnan, Kedarnath J ^a   Chakradhar, Srimat T ^a  

^a NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; DATA REDUCTION; FEEDBACK; FORMAL LOGIC; SIGNAL PROCESSING;

CONTROL SIGNALS; LFSR; RESEEDING; TEMPORAL COMPACTORS;

BLOCK CODES;

EID: 34047096433     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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3. M. Naruse, I. Pomeranz, S. M. Reddy, and S. Kundu. Onchip Compression of Output Responses with Unknown Values Using LFSR Reseeding. In Proceedings of IEEE International Test Conference, pages 1060-1068, 2003.
4. J. Rajski and et al. Embedded Deterministic Test for Low Cost Manufacturing Test. In Proceedings IEEE International Test Conference, pages 301-310, 2002.
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6. Y. Tang and et al. X-Masking During Logic BIST and Its Impact on Defect Coverage. In Proceedings IEEE International Test Conference, pages 442-451, 2004.