On discrimination between photorealistic and photographic images

ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings

Volumn 2, Issue , 2006, Pages

  Wang, Ying ^a   Moulin, Pierre ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL PHOTOGRAPHS; DIGITAL PHOTOREALISTIC IMAGES; WAVELET HISTOGRAMS;

FEATURE EXTRACTION; FUNCTIONS; PHOTOGRAPHY; VECTORS; WAVELET ANALYSIS;

IMAGE ANALYSIS;

EID: 33947705694     PISSN: 15206149     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. S. Lyu and H. Farid, "How realistic is photorealistic?" IEEE Trans. on Signal Processing, vol. 53, no. 2, pp. 845-850, Feb. 2005.
2. T.-T. Ng, S.-F. Chang, J. Hsu, L. Xie, and M. P. Tsui, "Physics-motivated features for distinguishing photo-graphic images and computer graphics," Proc. of ACM Multimedia, pp. 239-248, Singapore, Nov. 2005.
3. T. Whitted, "An improved illumination model for shaded display," Communications of the ACM, vol. 23, no. 6, pp. 343-349, 1980.
4. H. W. Jensen, S. R. Marschner, M. Levoy, and P. Hanrahan, "A practical model for subsurface light transport," Proc. of the ACM Special Interest Group on Computer Graphics and Interactive Techniques, pp. 511-518, ACM Press Addison-Wesley, New York, NY, 2001.
5. National Press Photographers Association, "Ethics in the age of digital photography," www.nppa.org/professional_development/self- training_resources/eadp_report/index.html.
6. S. L. Leach, "Seeing is no longer believing," www.csmonitor.com/2005/0202/p15s02-lire.html.
7. B. Fleming, 3D Photorealism Toolkit. Wiley, New York, 1998.
8. I. Wald, T. Kollig, C. Benthin, A. Keller, and P. Slusallek, "Interactive global illumination using fast ray tracing," Proc. of Thirteenth Eurographics Workshop on Rendering, P. Debevec and S. Gibson, Eds., Pisa, Italy, June 2002.
9. Y. Wang and P. Moulin, "Statistical modelling and steganalysis of DFT-based image steganography," Proc. of SPIE Electronic Imaging, San Jose, CA, Jan. 2006.
10. G. Xuan, Y. Q. Shi, J. Gao, D. Zou, C. Yang, Z. Zhang, P. Chai, C. Chen, and W. Chen, "Steganalysis based on multiple features formed by statistical moments of wavelet characteristic functions," Proc. of Information Hiding Workshop (IHW05), Barcelona, Spain, June 2005.
11. R. O. Duda, P. E. Hart, and D. G. Stork, Pattern Classification, 2nd ed. Wiley, New York, NY, 2001.