Method for analysing luminous intensity of light-emitting diodes

Measurement Science and Technology

Volumn 18, Issue 1, 2007, Pages 223-229

  Manninen, P ^a   Hovila, J ^a   Karha P ^a   Ikonen, E ^a,b  

^a AALTO UNIVERSITY   (Finland)

^b CENTRE FOR METROLOGY AND ACCREDITATION MIKES   (Finland)

Author keywords

Inverse square law; Lenses; Light emitting diodes; Photometry

Indexed keywords

LENSES; MEASUREMENT THEORY; PHOTOMETRY; STATISTICAL METHODS;

INVERSE SQUARE LAW; LUMINOUS INTENSITY;

LIGHT EMITTING DIODES;

LENSES; LIGHT EMITTING DIODES; MEASUREMENT THEORY; PHOTOMETRY; STATISTICAL METHODS;

EID: 33947701065     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/1/028     Document Type: Conference Paper

References (22)

1. Sauter G 1991 Metrologia 28 239-42
2. Benavides J M and Webb R H 2005 Appl. Opt. 44 4000-3
3. Agaphonov D R, Ivanov V S, Sapritsky V I and Stolyarevskaya R I 2000 Metrologia 37 587-90
4. Ohno Y 2006 Proc. SPIE 6046 604625
5. Godo K, Saito T, Shitomi H, Zama T and Saito I 2005 Proc. NEWRAD2005 p 199 Available online at http://www.pmodwrc.ch/newrad2005/pdfabstracts/Newrad095. pdf
6. Cuong T V, Cheong H S and Hong C-H 2004 Phys. Status Solidi C 1 2433-7
7. Madigan C F, Lu M H and Sturm J C 2000 Appl. Phys. Lett. 76 1650-2
8. Luo H, Kim J K, Schubert E F, Cho J, Sone C and Park Y 2005 Appl. Phys. Lett. 86 243505
9. Norris A W, Bahadur M and Yoshitake M 2005 Proc. SPIE 5941 207-13
10. Gillies G T 1980 Am. J. Phys. 48 418-9
11. Muray K 1991 Appl. Opt. 30 2178-86
12. Bürmen M, Pernu F and Likar B 2006 Meas. Sci. Technol. 17 1372-8
13. Muray K 1988 Proc. Soc. Photo-opt. 954 560-7
14. Commission Internationale de l'Eclairage 2003 CIE Publication 127.2
15. Nicodemus F E 1979 Self-Study Manual on Optical Radiation Measurements (Washington, DC: National Bureau of Standards) pp 91-119
16. Walsh J W T 1965 Photometry (New York: Dover) pp 120-73
17. Altendorf E 2003 Proc. SPIE 4996 208-20
18. Sauter G 2001 2nd CIE Expert Symp. on LED Measurement (presentation)
19. Ikonen E, Manninen P, Hovila J and Kärhä P 2006 Proc. Metrology Symp. (Queretaro) (CD, 5 pp)
20. Toivanen P, Kärhä P, Manoochehri F and Ikonen E 2000 Metrologia 37 131-40
21. Manoochehri F, Kärhä P, Palva L, Toivanen P, Haapalinna A and Ikonen E 1999 Anal. Chim. Acta 380 327-37
22. Kärhä P, Manninen P, Hovila J, Seppälä L and Ikonen E 2005 Proc. NEWRAD2005 pp 211-2 Available online at http://www.pmodwrc.ch/ newrad2005/pdfabstracts/Newrad044.pdf