Nanostructured gamma-alumina formed during anodic bonding of Al/Glass

Solid State Ionics

Volumn 178, Issue 3-4, 2007, Pages 179-185

  Xing, Qingfeng ^a   Sasaki, Gen ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Aluminum; Anodic bonding; Glass; Oxidation; TEM

Indexed keywords

ALUMINA; AMORPHOUS MATERIALS; ANODES; CHEMICAL BONDS; CRYSTAL DEFECTS; DIFFUSION; GLASS; GRAIN BOUNDARIES;

AMORPHOUS LAYERS; AMORPHOUS REGIONS; ANODIC BONDING; CRYSTALLOGRAPHIC DEFECTS;

NANOSTRUCTURED MATERIALS;

EID: 33947699371     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2006.12.012     Document Type: Article

References (20)

1. Wallis G., and Pomerantz D.I. J. Appl. Phys 40 10 (1969) 3946
2. Carson D.E., Hang K.W., and Stockdale G.F. J. Am. Ceram. Soc 55 7 (1972) 337
3. M.A. Morsy, Interfacial Phenomena in Anodic Bonding of Glass to Metals and Semiconductor, Doctoral thesis, Osaka University, 1997.
4. Nitzsche P., Lange K., Schmidt B., Grigull S., Kreissig U., Thomas B., and Herzog K. J. Electrochem. Soc 145 5 (1998) 1755
5. Xing Q.F., Yoshida M., and Sasaki G. Scr. Mater 47 9 (2002) 577
6. Wallis G. J. Am. Ceram. Soc 53 10 (1970) 563
7. Xing Q., Sasaki G., and Fukunaga H. J. Mater. Sci., Mater. Electron 13 2 (2002) 83
8. Xing Q.F., and Sasaki G. JMSE/JAMSE Inter. Conf. Mater. Proc., Oct, Hawaii (2002) 41
9. van Helvoort A.T.J., Knowles K.M., and Fernei J.A. J. Am. Ceram. Soc 86 10 (2003) 1773
10. Q. Xing, G. Sasaki, unpublished data.
11. van Helvoort A.T.J., Knowles K.M., Holmestad R., and Fernie J.A. Philos. Mag 84 6 (2004) 505
12. Brownlow J.M. IBM Research Report No. RC-7101 (1978) May
13. Takahashi M., Yasuda H., and Ikeuchi K. Solid State Ionics 172 (2004) 335
14. Edington J.W. Electron Diffraction in the Electron Microscope (1975), Philips Technical Laboratory 29
15. X-ray powder diffraction file, JCPDS 50-741 (2002).
16. X-ray powder diffraction file, JCPDS 10-425 (2002).
17. Doherty P.E., and Davis R.S. J. Appl. Phys 34 3 (1963) 619
18. Eldridge J.E., Hussey R.J., Mitchell D.F., and Graham M.J. Oxid. Met 30 5/6 (1998) 301
19. Jeurgens L.P.H., Sloof W.G., Tichelaar F.D., and Mittemeijer E.J. Thin Solid Films 418 2 (2002) 89
20. Jimenez-Gonzalez A., and Schmeisser D. Surf. Sci 250 1-3 (1991) 59