Bulk and interfacial effects in exchange bias systems

Journal of Physics D: Applied Physics

Volumn 40, Issue 5, 2007, Pages 1293-1299

  Dutson, J D ^a   Huerrich, C ^a   Vallejo Fernandez, G ^a   Fernandez Outon, L E ^a   Yi, G ^b   Mao, S ^b   Chantrell, R W ^a   O'Grady, K ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

^b SEAGATE TECHNOLOGY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COBALT ALLOYS; DEPOSITION; NICKEL ALLOYS; THICKNESS MEASUREMENT;

EXCHANGE BIAS SYSTEMS; FERROMAGNETIC LAYERS; INTERFACIAL EFFECTS; THERMAL ACTIVATION;

FERROMAGNETIC MATERIALS;

EID: 33947685948     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/5/S16     Document Type: Article

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