Real-time 3D profile measurement using structured light

Journal of Physics: Conference Series

Volumn 48, Issue 1, 2006, Pages 339-343

  Xu, L ^a   Zhang, Z J ^a   Ma, H ^a   Yu, Y J ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33947668771     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/48/1/063     Document Type: Article

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