Parallel nano-differential scanning calorimetry: A new device for combinatorial analysis of complex nano-scale material systems

Materials Research Society Symposium Proceedings

Volumn 924, Issue , 2006, Pages 133-138

  McCluskey, Patrick James ^a   Vlassak, Joost J ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; MICROMACHINING; NICKEL COMPOUNDS; THIN FILMS;

COMBINATORIAL ANALYSIS; COMBINATORIAL CALORIMETRY; POWER COMPENSATION;

NANOSTRUCTURED MATERIALS;

EID: 33947653112     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0924-z08-14     Document Type: Conference Paper

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5. V. Chiroiu, L. Munteanu, Proceedings of The Romanian Academy 4(1), 2003