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1
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0001013731
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Castellani, M. P.; Wright, J. M.; Geib, S. J.; Rheingold, A. L.; Trogler, W. C. Organometallics 1986, 5, 1116-1122.
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(1986)
Organometallics
, vol.5
, pp. 1116-1122
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Castellani, M.P.1
Wright, J.M.2
Geib, S.J.3
Rheingold, A.L.4
Trogler, W.C.5
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2
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33947660775
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Synthesis of 3: a solution of 2 (1.0 g, 1.72 mmol) in CHCl3 (5 mL) was added to a 1000 mL Erlenmeyer flask, and the solvent was allowed to evaporate slowly. A film of 2 was formed on the glass wall. Slow oxidation of a colorless film of 2 in the air after 2 months yielded a pink film containing 8% of 3 and 90% unreacted 2. When the film of 2 was first pretreated with dilute aqueous NaOH and then dilute aqueous HCl, the yield of 3 was 20% after exposure to air for 1 month. The film was dissolved in toluene (50 mL, After separation by preparative GPC (toluene elution, pink crystals of 3 were obtained in 15% yield. Anal. Calcd for C41H30-SiO2: C, 84.54; H, 5.15. Found: C, 84.12; H, 5.40. 1H NMR (300.133 MHz, CDCl 3, δ 8.06-8.02 (m, 4H, 7.51 (d, 4H, 7.39-7.31 (m, 8H, 7.19 (t, 4H, 6.95 (t, 2H, 6.82 (t, 4H, 6.64 (d, 4H, 13C NMR 125.710 MHz, CDCl3, δ 184.43, 176.71, 136.88, 136.23
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+). Mp: 197-199 °C.
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4
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33845282084
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Arduengo, A. J., III; Steward, C. A.; Davidson, F.; Dixon, D. A.; Becker, J. Y.; Culley, S. A.; Mizen, M. B. J. Am. Chem. Soc. 1987, 109, 627-647.
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(1987)
J. Am. Chem. Soc
, vol.109
, pp. 627-647
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Arduengo III, A.J.1
Steward, C.A.2
Davidson, F.3
Dixon, D.A.4
Becker, J.Y.5
Culley, S.A.6
Mizen, M.B.7
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5
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33947628031
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Crystal structure analysis of 3: Brüker Smart CCD-1000 diffractometer, T, 173(2) K, Mo Kα radiation (λ, 0.710 73 Å, ω scans, C41H30O2-Si, M r, 582.74, monoclinic, space group C2/c, a, 23.5233(15) Å, b, 11.0132(8) Å, c, 15.5384(11) Å, β= 130.891(1)°, V, 3043.1(4) Å3, Z, 4, ρcalcd, 1.272 g/cm -3, μ, 0.114 mm-1, F(000, 1224, θ range 2.18-25.00°, 7417 reflections collected, 2549 (R(int, 0.0261) unique, maximum/minimum transmission 0.9667/0.9559, no. of data/restraints/ parameters 2549/0/201, R1, 0.0421, wR2, 0.128 87. Crystallographic data (excluding structure factors) for the structure reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as Supplementary Publication No. CCDC-167495. Copies of the data can be obtained free of charge on application to the CCDC, 12 Union R
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-1, F(000) = 1224, θ range 2.18-25.00°, 7417 reflections collected, 2549 (R(int) = 0.0261) unique, maximum/minimum transmission 0.9667/0.9559, no. of data/restraints/ parameters 2549/0/201, R1 = 0.0421, wR2 = 0.128 87. Crystallographic data (excluding structure factors) for the structure reported in this paper have been deposited with the Cambridge Crystallographic Data Centre as Supplementary Publication No. CCDC-167495. Copies of the data can be obtained free of charge on application to the CCDC, 12 Union Road, Cambridge CB2 1EZ, U.K. (fax, (+44) 1223-336-033; e-mail, deposit@ccdc.cam.ac.uk).
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6
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22944454317
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Dalton Trans.
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See for example
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See for example: Bancroft, G. M.; Davies, B. W.; Payne, N. C.; Sham, T. K. Dalton Trans.: Inorg. Chem. 1975, 11, 973-8
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(1975)
Inorg. Chem
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, pp. 973-978
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Bancroft, G.M.1
Davies, B.W.2
Payne, N.C.3
Sham, T.K.4
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7
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0034787255
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and Campo, J. A.; Cano, M.; Heras, J. V.; Lagunas, M. C.; Perles, J.; Pinilla, E.; Torres, M. R. Helv. Chem. Acta 2001, 84, 2316-2329.
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(2001)
Helv. Chem. Acta
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Campo, J.A.1
Cano, M.2
Heras, J.V.3
Lagunas, M.C.4
Perles, J.5
Pinilla, E.6
Torres, M.R.7
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12
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0000024039
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Rappoport, Z, Apeloig, Y, Eds, Wiley: Chichester, U.K
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Kost, D.; Kalikhman, I. In The Chemistry of Organic Silicon Compounds; Rappoport, Z., Apeloig, Y., Eds.; Wiley: Chichester, U.K., 1998; Vol. 2, Part 2, pp 1339-1445.
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(1998)
The Chemistry of Organic Silicon Compounds
, vol.2
, Issue.PART 2
, pp. 1339-1445
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Kost, D.1
Kalikhman, I.2
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13
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0003520774
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4th ed, Wiley: New York
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Silverstein, R. M.; Bassler, G. C.; Morrill, T. C. Spectrometric Identification of Organic Compounds, 4th ed.; Wiley: New York, 1981; p 267.
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(1981)
Spectrometric Identification of Organic Compounds
, pp. 267
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Silverstein, R.M.1
Bassler, G.C.2
Morrill, T.C.3
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14
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33947711625
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The quantum yield for emission was measured in dilute hexane solution in which the UV absorbance was between 0.05 and 0.01, using Rhodamine B as a standard with excitation at 366 nm, and was calculated using Φs, Φr(ArFs/As,F r)ns2/nr2
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r2).
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16
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0006537530
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Lindon, J. C, Tranter, G. E, Holmes, J. L, Eds, Academic Press: San Diego, CA
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Omary, M. A.; Patterson, H. H. In Encyclopedia of Spectrascopy and Spectrometry, Lindon, J. C., Tranter, G. E., Holmes, J. L., Eds.; Academic Press: San Diego, CA, 1999; pp 1186-1207.
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(1999)
Encyclopedia of Spectrascopy and Spectrometry
, pp. 1186-1207
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Omary, M.A.1
Patterson, H.H.2
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