Elastodynamic characterization of imprinted nanolines

Materials Research Society Symposium Proceedings

Volumn 924, Issue , 2006, Pages 151-156

  Johnson, Ward L ^a   Flannery, Colm M ^a   Kim, Sudook A ^a   Geiss, Roy ^a   Heyliger, Paul R ^b   Soles, Chris L ^a   Hu, Walter ^c   Pang, Stella W ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Department of Mechanical Engineering   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; ELASTIC MODULI; FINITE ELEMENT METHOD; LIGHT SCATTERING; POLYMETHYL METHACRYLATES;

FARNELL-ADLER CALCULATIONS; IMPRINT LITHOGRAPHY; NANOIMPRINTED LINES;

NANOSTRUCTURED MATERIALS;

EID: 33947634430     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0924-z08-31     Document Type: Conference Paper

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