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Volumn 25, Issue 1, 2007, Pages 33-43

Scaling of nonvolatile memories to nanoscale feature sizes

Author keywords

Flash memories; Molecular memories; NAND; Nonvolatile memories; NOR; Organic memories

Indexed keywords

FERROELECTRICITY; FLASH MEMORY; LOGIC GATES; MAGNETIC STORAGE; PHASE TRANSITIONS;

EID: 33947619932     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (36)
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    • BYEOND.-S., LEE S.-S., LIM Y.-H., PARK, J.-S., HAN W.-K., KWAK P.-S., KIM D.-H., CHAE D.-R, MOON S.-H., LEE S.-J., CHO H.-C., LEE J.-W., KIM M.-S., YANG J.-S., PARK Y.-W., BAE D.-W., CHOI J.-D., HUR S.-H., SUH K.-D., Proc. Int. Solid State Circuits Conference, IEEE, San Francisco (2005), p. 46.
    • BYEOND.-S., LEE S.-S., LIM Y.-H., PARK, J.-S., HAN W.-K., KWAK P.-S., KIM D.-H., CHAE D.-R, MOON S.-H., LEE S.-J., CHO H.-C., LEE J.-W., KIM M.-S., YANG J.-S., PARK Y.-W., BAE D.-W., CHOI J.-D., HUR S.-H., SUH K.-D., Proc. Int. Solid State Circuits Conference, IEEE, San Francisco (2005), p. 46.
  • 6
    • 0036639637 scopus 로고    scopus 로고
    • CASPERSON J., J. Appl. Phys., 92 (2002), 261.
    • CASPERSON J., J. Appl. Phys., 92 (2002), 261.
  • 22
    • 28044458676 scopus 로고    scopus 로고
    • E. Zschech, C. Whelan, T. MikolajickEds, Springer, London
    • Materials for Information Technology, E. Zschech, C. Whelan, T. Mikolajick(Eds.), Springer, London, 2005, p. 112.
    • (2005) Materials for Information Technology , pp. 112
  • 24
    • 33947636865 scopus 로고    scopus 로고
    • LEE S. Y., Extended Abstracts of the International Conference on Solid State Devices and Materials, Kobe, Japan (2005), p. 1026.
    • LEE S. Y., Extended Abstracts of the International Conference on Solid State Devices and Materials, Kobe, Japan (2005), p. 1026.
  • 26
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    • GALAGHER W.J., IEEE VLSI-TSA Int. Symp. VLSI Technology, Kyoto, Japan (2005), p. 72.
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  • 30
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    • SECZI R., WALTER A., ENGL R., MALTENBERGER A., SCHUMANN J., KUND M., DEHM C., IEDM Digest Techn. Papers IEEE (2003), 10.2.1.
    • SECZI R., WALTER A., ENGL R., MALTENBERGER A., SCHUMANN J., KUND M., DEHM C., IEDM Digest Techn. Papers IEEE (2003), 10.2.1.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.